Western Digital NVMe solid state drives provide the trusted performance reliability, and security demanded by enterprise environments. The Ultrastar DC SN655 NVMe SSD expands the Ultrastar SN65x family with a dual-port drive, expanded encryption capabilities, added performance, and multiple capacities now up to 61.44TB. Ultrastar NVMe SSDs continue to be the ideal solution for cloud and server providers who need performant, highcapacity, cost-optimized, read-intensive performance for their data-intensive applications. With dual-port redundancy and failover capability, end-to-end data protection and additional enterprise features, the SN655 helps ensure your data is secure and available when needed. With high-capacity, low-latency performance reaching up to 1.1M IOPs, storage providers are efficiently able to increase capacity for modern applications processing large unstructured datasets for analytics, artificial intelligence, or machine learning. With these workloads growing to gigabytes and even petabytes, storage-optimized Ultrastar NVMe SSDS are reducing time-to-insights of big data and enabling efficient machine learning.
The MG09 Series provides 18 TB of conventional magnetic recording (CMR) capacity. The industry-standard 3,5 form-factor provides 7200 rpm performance, and integrates easily into cloud-scale storage infrastructure, business-critical servers and storage, and File and Object storage solutions. The helium-sealed design reduces aerodynamic drag to significantly lower the drive's operational power profile, which helps deliver critical TCO benefits for data center infrastructures. The sealed design and corrosion resistant electronics also mitigate against life-time failure modes due to air bourn pollutants and other environmental factors. The massive 18 TB CMR capacity is delivered using Toshiba's innovative Flux Control Microwave Assisted Magnetic Recording (FC-MAMR) technology. These advances help the MG09 Series to achieve optimum storage capacity and application compatibility, with unsurpassed data reliability.